Dedicated 2D V-I Dynamic Impedance Port Test Channels for Integrated Circuits: 256 channels
Dedicated 2D V-I Dynamic Impedance Port Test Channels for Circuit Boards: 64/128/192/256 channels (expandable to 2048 channels)
3D Swept Frequency V-I-F Dynamic Impedance Port Test Channels: 64/128/192/256 channels (expandable to 2048 channels)

Functional Applications:
1) Quality control inspection and screening of incoming integrated circuits, consistency testing;
2) Rapid screening of counterfeit and imitation integrated circuits and components;
3) Three-dimensional dynamic impedance failure analysis for defective components;
4) Comprehensive port dynamic impedance testing and analysis of integrated circuits and circuit boards under non-powered conditions;
5) Quick and accurate localization of faulty pins in defective integrated circuits, efficient identification of failed I/O pins on faulty circuit boards;
6) Safe and reliable testing, comprehensively addressing process issues in components and circuit boards, quickly resolving fault localization in integrated circuits and circuit boards;
7) Impedance consistency testing for integrated circuits and circuit boards;
8) Customized and user-programmable testing for integrated circuits and circuit boards with dedicated control platform software.

Technical Specifications:
1) 256 channels of dedicated 2D V-I port dynamic impedance testing for integrated circuits;
2) 64/128/192/256 channels of dedicated 2D V-I port dynamic impedance testing for circuit boards;
3) 64/128/192/256 channels of V-I-F three-dimensional dynamic impedance testing;
4) 4 probe test channels, 4 V-T/V-T-F test channels;
5) Display modes: V-I, V-T, V-I-F, V-T-F;
6) Customizable universal integrated circuit test fixtures for various packages;
7) Customizable test fixtures for various circuit board I/O interfaces;
8) System provides customizable test report output; dedicated test operation software in Chinese and English;
9) The device can be expanded in 64-channel increments up to 2048 test channels.

Testing Principle (V-I Curve Testing):
A safe, low-power scanning drive signal is applied to each pin of the component, generating an impedance signature map for comparison and storage.
The device under test is compared with the standard dynamic impedance map in the database; the degree of difference in the impedance map determines the component's quality and usability.
Test signal parameters that can be set include: voltage, waveform, source resistance, frequency. These can be adjusted as needed to obtain accurate information.

Integrated Circuit Testing Made So Simple:
1. Select the integrated circuit model to test from the database.
2. Insert the integrated circuit into the test socket.
3. Execute the test.
4. Obtain a PASS or FAIL test result.

No electronic expertise required.
Suitable for all integrated circuits/packaged components and various types of circuit boards.
Flexible, easy to install, and user-friendly.
Direct test results: PASS or FAIL.
Software allows setting various test conditions.
Comprehensive customizable integrated circuit test analysis reports available.

The UK ABI-AT256 A4 Universal Integrated Circuit Tester is suitable for components in various package forms:
-Dual In-Line (DIL)
-Small Outline Integrated Circuit (SOIC)
-Small Outline Packages (SSOP, TSOP)
-Plastic Leaded Chip Carrier (PLCC)
-Thin Quad Flat Pack (TQFP, PQFP, LQFP)
-Ball Grid Array (BGA)
Note: The AT256 A4 is not limited to testing electronic integrated circuits only; it can also be used for testing entire circuit boards.

Three-Dimensional V-I-F Dynamic Impedance Port Testing

AT256 A4 Test Report

AT256 A4 Integrated Circuit Tester
Dedicated 2D V-I Dynamic Impedance Port Test Channels for Integrated Circuits: 256 channels
Dedicated 2D V-I Dynamic Impedance Port Test Channels for Circuit Boards: 64/128/192/256 channels (expandable to 2048 channels)
3D Swept Frequency V-I-F Dynamic Impedance Port Test Channels: 64/128/192/256 channels (expandable to 2048 channels)

Beijing Jinsanhang Technology Development Co., Ltd. (UK ABI Technical Service Center) provides:
   Technical training services for the use of integrated circuit testers, integrated circuit screening testers, component screening testers, component detectors, and three-dimensional dynamic impedance testers, as well as test program development and compilation services. For detailed information, please click: http://www.2468.cn