Transistor Curve TracerProduct Introduction  

The product features a desktop structure designed for tabletop placement, consisting of two main components: the test host and the programmable computer. It supports external fixtures and adapters, and can also connect to sorting machines and robotic arms via optional Prober interface and Handler interface (16Bin) to establish a workstation for rapid batch testing. Through software settings, it can automatically classify and store components based on their parameter grades. It is capable of handling various scenarios such as "Incoming Inspection," "Failure Analysis," "Selection and Matching," and "Mass Production Testing."

The product demonstrates excellent performance in reliability, repeatability of test data, and testing efficiency. The innovative "point-control fixture" allows operators to perform tests with a single touch on the fixture, making operations simpler and more efficient. Test data can be saved as Excel text.

Transistor Curve TracerApplication Scenarios

? Testing and Analysis (Initial testing during the R&D and design phase of power devices)

? Failure Analysis (Testing and analyzing failed devices to identify failure mechanisms, enabling improvements in the overall design and usage process of electronic systems)

? Selection and Matching (Conducting comprehensive testing before devices are soldered onto circuit boards, and classifying and pairing devices with consistent test data)

? Incoming Inspection (Sampling or full inspection of incoming devices by quality departments (IQC) of research institutes and electronics factories to control device yield)

? Mass Production Testing (Can connect to various auxiliary mechanical equipment such as robotic arms, barcode scanners, and sorting machines to achieve large-scale, automated testing)

Transistor Curve TracerProduct Features

(1) Capable of testing 7 major categories and 26 types of electronic components;

(2) PC serves as the main control unit of the system;

(3) Fill-in menu software interface developed based on the LabVIEW platform;

(4) Automatic identification of device polarity NPN/PNP; (5) 16-bit ADC, 100K/S sampling rate;

(6) Programmable high-voltage source 10~1400V, with optional 2KV configuration;

(7) Programmable high-current source 1uA~40A, with optional 100A, 300A, 500A configurations;

(8) Drive voltage 10mV~40V;

(9) Control electrode current 10uA~10mA;

(10) Four-wire Kelvin connection ensures accurate loading and measurement;

(11) Calibration via RS232 interface connection to a digital meter for system verification;

(12) Optional Prober interface and Handler interface (16Bin);

(13) Provides users with a wide range of test adapters;

(14) Testing capacity of 10,000 units per hour when connected to a sorting machine;

(15) Capable of testing junction capacitance, such as Cka, Ciss, Crss, Coss;

(16) Automatic pulse current heating function for high-temperature testing, eliminating the need for external heating devices;

Transistor Curve TracerProduct Information and Specifications

Product Model: HUSTEC-DC-2010

Product Name: Discrete Device Tester

Host Dimensions: 660mm (L) * 430mm (W) * 210mm (H)

Host Weight: <35kg

Host Power Consumption: <300W

Altitude: Not exceeding 4000m;

Environmental Requirements: -20℃～60℃ (storage), 5℃～50℃ (operation);

Relative Humidity: 20%RH～75%RH (no condensation, wet-bulb temperature below 45℃);

Atmospheric Pressure: 86Kpa～106Kpa;

Protection Conditions: No significant dust, corrosive gases, conductive particles, etc.;

Grid Requirements: AC220V, ±10%, 50Hz±1Hz;

Operating Time: Continuous;

Testing Range

01. Diode / Diodes (Zener, transient, three-terminal Schottky, TVS, rectifier bridge, three-phase rectifier bridge)

02. BJT / Bipolar Junction Transistors

03. Mosfet & JFET / Field-Effect Transistors

04. SCR / Silicon-Controlled Rectifiers (unidirectional/bidirectional)

05. IGBT / Insulated Gate Bipolar Transistors

06. OC / Optocouplers

07. Relay / Relays

08. Darlington tube / Darlington Arrays

09. Current sensor / Current Sensors

10. Reference IC (TL431)

11. Voltage Reset IC

12. Voltage Regulators (three-terminal/four-terminal)

13. Three-Terminal Switching Power Drivers

14. Seven-Terminal Half-Bridge Drivers

15. High-Side Power Switches

16. Voltage Protectors (single/dual group)

17. Switching Regulator Integrators

18. Varistors

19. Voltage Monitors

Application Scenarios

1. Testing and Analysis (Initial testing during the R&D and design phase of power devices, primarily functioning as a curve tracer)

2. Failure Analysis (Testing and analyzing failed devices to identify failure mechanisms, enabling improvements in the overall design and usage process of electronic systems)

3. Selection and Matching (Conducting comprehensive testing before devices are soldered onto circuit boards, and classifying and pairing devices with consistent test data)

4. Incoming Inspection (Sampling or full inspection of incoming devices by quality departments (IQC) of research institutes and electronics factories to control device yield)

5. Mass Production Testing (Can connect to various auxiliary mechanical equipment such as robotic arms, barcode scanners, and sorting machines to achieve large-scale, automated testing)

6. Import Substitution (Can replace imported products of the same level)