HUSTECHuake Zhiyuan

IGBT Static Parameter Test System

I: Main Features of the Static Parameter Test System

Huake Zhiyuan's electrical parameter tester can be used for testing IGBTs in various package forms, as well as measuring the V-I characteristics of high-power diodes, IGBT modules, high-power IGBTs, high-power bipolar transistors, MOSFETs, and other devices. It tests various power devices up to 600A (expandable to 2000A) and 5000V, widely applied in industries such as rail transportation, electric vehicles, wind power generation, inverters, and welding machines for IGBT incoming material selection and failure analysis. The equipment can also be used for online maintenance in industries like inverters, wind power, rail transportation, and welding machines without the need to remove components from the circuit board for separate testing, enabling convenient online IGBT detection. The testing process is simple: parameters can be set directly in the test host for immediate testing, or automated testing can be performed via software-controlled host programming. Static parameter testing of IGBTs is completed through computer operation.

Static Parameter Test System Test Parameters:

ICES Collector-Emitter Leakage Current

IGESF Forward Gate Leakage Current

IGESR Reverse Gate Leakage Current

BVCES Collector-Emitter Breakdown Voltage

VGETH Gate-Emitter Threshold Voltage

VCESAT Collector-Emitter Saturation Voltage

ICON On-State Collector Current

VGEON On-State Gate Voltage

VF Diode Forward Voltage Drop

The entire testing process is automated. The computer software includes a database management and query function, and can generate test curves for ease of operation.

II: Application Scope of the Static Parameter Test System

A: IGBT discrete devices and modules

B: High-power MOSFETs

C: High-power diodes

D: Standard low-resistance resistors

E: Screening and online fault detection in industries such as rail transportation, wind power generation, new energy vehicles, inverters, and welding machines

III: Features of the Static Parameter Test System:

A: Measures various IGBTs and MOSFETs

B: Pulse current 1200A, voltage 5KV, wide testing range

C: Pulse width 50μS~300μS

D: Vce measurement accuracy 2mV

E: Vce measurement range >10V

F: Computer graphical display interface

G: Intelligent protection for measured devices

H: Host computer with database functionality

I: Measures internal diode voltage drop of MOSFET/IGBT

J: Tests all static parameters of IGBT in one go

Generates test curves (IV curves visually display IGBT characteristics, enabling failure analysis and fault localization)

L: Allows comparison of different curves to observe the curve status of products from the same batch or compare curves of the same specification parameters from different manufacturers

Huake Zhiyuan's Static Parameter Test System is an intelligent test system developed specifically for various static parameters of IGBTs. It features high automation (automatically operates according to the program set by the operator), records test results via computer, stores test results in text format, offers flexible testing methods (capable of testing discrete devices as well as single-unit and multi-unit modules), ensures safety and stability (real-time monitoring of equipment status with hardware interlocking), includes safety protection functions, and provides fast and convenient testing speed.