Huake Zhiyuan Gate Resistance Tester can test the gate resistance and gate capacitance of MOSFETs, IGBTs, and SiC devices, including parameters such as Ciss (input capacitance), Coss (output capacitance), Crss (reverse capacitance), and Rg. It supports both single-point testing and scanning test curves.

Brand: Huake Zhiyuan
Name: Gate Resistance Tester
Model: HUSTEC-CV-1200
Application: Testing MOSFET junction capacitance, Ciss input capacitance, Coss output capacitance, Crss reverse capacitance, Rg, and other parameters

Product Details

Measurable Parameters: Ciss/Coss/Crss/Rg MOSFET Junction Capacitance Testing

Testable Devices: IGBTs, diodes, GaN, SiC MOSFETs, etc.

Test Frequency: 1MHz

Test Voltage Range: Vds 0~1200V, Vgs ±25V

Signal Voltage Range: 1mV~1000mV

Rg Range: ≤300Ω

Test Accuracy: 0.01pF



Features of Huake Zhiyuan Gate Resistance/Gate Capacitance Tester:

1. Fast testing speed.

2. Supports point testing and curve scanning.

3. High test accuracy with stable and precise results.

4. Allows real-time saving of data and waveforms, and can directly generate images for datasheets or CSV point files.